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Dr. Vincent O'Brien

Biography

Vincent joined the Mixed Signal IC Research group as a M.Eng student in 2007. In 2009 he completed his research masters titled 'A High Precision Analog Signal Generator for ADC Test' and thereafter was employed as a Research Assistant with the Mixed Signal IC Research group within the centre. His research is primarily focused on the area of mixed signal IC design and test with specific interest in the design of sigma delta digital to analog converters. Since 2012 he has been pursuing a Ph.D. entitled 'Mismatch and Inter-Symbol Interference Shaping Using Dynamic Element Matching'.

Research Interests

My research is focused on developing digital signal processing techniques for use in digital to analog converters, and the design and implementation of built-in self-test algorithms for analog to digital converters.

Professional Activities

Patent

  • 2013 US 8386209 B2 - 'Testing System', A programmable On-chip Test and Measurement Platform for Analog to Digital Converters.

Association

  • Member, IEEE

Publications

Book Chapters

2012

A 100dB SFDR 0.5V pk-pk band-pass DAC implemented on a Low Voltage CMOS Process
Brendan Mullane,Vincent O'Brien
(2012) A 100dB SFDR 0.5V pk-pk band-pass DAC implemented on a Low Voltage CMOS Process
In VLSI-SoC: Advanced Research for Systems on Chip; Berlin, Germany : Springer pp. 144-157
DOI: 10.1007/978-3-642-32770-4
[ULIR]

Peer Reviewed Journals

2017

Analysis of Feedback Predictive Encoder Based ADCs
Scanlan A., O'Hare D., Halton M., O'Brien V., Mullane B., and Thompson E.
(2017) Analysis of Feedback Predictive Encoder Based ADCs
In Compel-The International Journal For Computation And Mathematics In Electrical And Electronic Engineering;
[ULIR]

Conference Publications

2015

IEEE Applied Power Electronics Conference, (APEC)
Mooney, J; Halton, M; Iordanov, P; O'Brien, V;
(2015) IEEE Applied Power Electronics Conference, (APEC)
pp. 2835-2839 Charlotte, North Carolina
DOI: 10.1109/APEC.2015.7104752
[ULIR]

2014

25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
O'Brien, V.; MacNamee, C.; Mullane, B.
(2014) 25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
pp. 418-423 Limerick, Ireland
DOI: 10.1049/cp.2014.0725

2013

IEEE European Conference on Circuit Theory and Design, (ECCTD)
Mo H., Kennedy M. P., O'Brien V. and Mullane B.
(2013) IEEE European Conference on Circuit Theory and Design, (ECCTD)

2011

IEEE International Conference on Electronics, Circuits and Systems, (ICECS)
O'Brien, V.; Mullane, B
(2011) IEEE International Conference on Electronics, Circuits and Systems, (ICECS)
IEEE(Ed.)
DOI: 10.1109/ICECS.2011.6122254

2011

IFIP/IEEE International Conference on Very Large Scale Integration, (VLSI-SoC)
Mullane, B. and O'Brien V.
(2011) IFIP/IEEE International Conference on Very Large Scale Integration, (VLSI-SoC)

2009

IEEE European Test Symposium, (ETS)
Mullane B., MacNamee C., O'Brien V., and Fleischmann T.
(2009) IEEE European Test Symposium, (ETS)

2009

ACM Great Lakes Symposium on VLSI, (GLSVLSI)
Mullane B., MacNamee C., O'Brien V., Fleischmann T.
(2009) ACM Great Lakes Symposium on VLSI, (GLSVLSI)
pp. 81-86
DOI: 10.1145/1531542.1531564

2009

IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, (DDECS)
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T
(2009) IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, (DDECS)
pp. 4-7

2009

IEEE European Test Symposium, (ETS)
O'Brien V., Mullane M., Fleischmann T., and MacNamee C.
(2009) IEEE European Test Symposium, (ETS)

2009

IEEE International SOC Conference, (SOCC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
(2009) IEEE International SOC Conference, (SOCC)
pp. 169-172
DOI: 10.1109/SOCCON.2009.5398065

2009

International Test Conference, (ITC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
(2009) International Test Conference, (ITC)

DOI: 10.1109/TEST.2009.5355722