Dr. Ciaran MacNamee
Biography
Electronic and Computer Engineer, specialising in embedded systems development and digital design and testing.16 years industrial experience on electronic and embedded systems design
15 years academic experience, researching and teaching embedded systems design, digital systems design and test and computer architecture.
Research Interests
Design, development and testing and debugging of embedded system, with particular emphasis on debugging and verification of real-time systems.Test engineering, with emphasis on SoC test and low power scan testing.
Professional Activities
Award
- 2014 - Winter Award for Excellence in Teaching
Education
- 2008 University of Limerick - PhD
- 1996 University of Limerick - M.Eng
- 1980 NIHE, Limerick (now UL) - Graduate Diploma
- 1978 University College Dublin - BE
Employment
- 2000 University of Limerick - Lecturer Below The Bar
- 1986 Ashling Microsystems Ltd - Senior Design Engineer/Project Leader
- 1984 LDC/Milton Roy, Shannon Industrial Estate, Co Clare, Ireland - Electronic Engineer
- 1983 NIHE, Limerick (now University of Limerick) - Research Assistant
- 1982 Waterford Regional Technical College (now Waterford IT) - Temporary Lecturer
- 1978 SIFA Chemicals, Shannon Industrial Estate, Co Clare - Chemical Engineer
Association
- 1991 Member, IEEE
Peer Reviewed Journals
Runtime observation of functional safety properties in an automotive control network
Heffernan, D,MacNamee, C (2016) Runtime observation of functional safety properties in an automotive control network. Journal Of Systems Architecture :38-50
Runtime verification monitoring for automotive embedded systems using the ISO 26262 Functional Safety Standard as a guide for the definition of the monitored properties
Heffernan, D,MacNamee, C,Fogarty, P (2014) Runtime verification monitoring for automotive embedded systems using the ISO 26262 Functional Safety Standard as a guide for the definition of the monitored properties. IET Software :193-203
On-chip support for software verification and debug in multi-core embedded systems
Fogarty, P,MacNamee, C,Heffernan, D (2013) On-chip support for software verification and debug in multi-core embedded systems. IET Software :56-64
Design and implementation challenges for adoption of the IEEE 1500 standard
Higgins, M; MacNamee, C; Mullane, B (2010) Design and implementation challenges for adoption of the IEEE 1500 standard. Iet Computers And Digital Techniques :38-49
Design and implementation challenges for adoption of the IEEE 1500 standard
Higgins, M.,MacNamee, C.,Mullane, B. (2010) Design and implementation challenges for adoption of the IEEE 1500 standard. Computers & Digital Techniques, Ietcomputers & Digital Techniques, Iet :38-49
Debugging Techniques for real-time Embedded Systems
MacNamee, C; Heffernan, D (2001) Debugging Techniques for real-time Embedded Systems. Elektron Journal, South African Iee :23-26
Emerging on-chip debugging techniques for real-time embedded systems
MacNamee, C; Heffernan, D (2000) Emerging on-chip debugging techniques for real-time embedded systems. Computing & Control Engineering Journal :295-303
Books
Book Chapters
Strategies for a Flexible Approach to Incorporating Real Experiments in Blended Learning
Hall, T; McHugo, C; MacNamee, C; Hayes, MJ (2004) Strategies for a Flexible Approach to Incorporating Real Experiments in Blended Learning. New Achievements for DLE in the ViReC Project 2004 :9-13
Edited Books
Other Journals
Conference Publications
On-chip Instrumentation for Runtime Verification in Deeply Embedded Processors
MacNamee, C,Heffernan, D, (2015) On-chip Instrumentation for Runtime Verification in Deeply Embedded Processors. 2015 Ieee Computer Society Annual Symposium On Vlsi :374-379
ISVLSI 2015 - IEEE International Conference on VLSI, Montpellier, France.
MacNamee, C., Heffernan, D. (2015) ISVLSI 2015 - IEEE International Conference on VLSI, Montpellier, France..
Performance Verification of a 12-Bit, 25Msps, Successive Approximation Register Analogue-to-Digital Converter on 65nm CMOS
Egan, M,MacNamee, C,Scanlan, T, (2015) Performance Verification of a 12-Bit, 25Msps, Successive Approximation Register Analogue-to-Digital Converter on 65nm CMOS. 2015 26th Irish Signals And Systems Conference (Issc)
25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
Indino, I., MacNamee, C. (2014) 25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).. :227-232
25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
O'Brien, V.; MacNamee, C.; Mullane, B. (2014) 25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).. :418-423
IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T (2009) IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS. :169-172
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, (DDECS)
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T (2009) IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, (DDECS) . :4-7
IEEE International SOC Conference, (SOCC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T. (2009) IEEE International SOC Conference, (SOCC). :169-172
International Test Conference, (ITC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T. (2009) International Test Conference, (ITC).
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
Mullane B., O'Brien V., MacNamee C., Fleischmann T. (2009) Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009. :4-7
A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. Test Conference, 2009. ITC 2009. International
Mullane, B.,O'Brien, V.,MacNamee, C.,Fleischmann, T. (2009) A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. Test Conference, 2009. ITC 2009. International. Test Conference, 2009. ITC 2009. International :1-10
ACM Great Lakes Symposium on VLSI, (GLSVLSI)
Mullane B., MacNamee C., O'Brien V., Fleischmann T. (2009) ACM Great Lakes Symposium on VLSI, (GLSVLSI). :81-86
GLSVLSI 2009: PROCEEDINGS OF THE 2009 GREAT LAKES SYMPOSIUM ON VLSI
Mullane, B,MacNamee, C,O'Brien, V,Fleischmann, T, (2009) GLSVLSI 2009: PROCEEDINGS OF THE 2009 GREAT LAKES SYMPOSIUM ON VLSI. Glsvlsi 2009: Proceedings Of The 2009 Great Lakes Symposium On Vlsi :81-86
ITC: 2009 INTERNATIONAL TEST CONFERENCE
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T (2009) ITC: 2009 INTERNATIONAL TEST CONFERENCE. :368-377
Proceedings - IEEE Computer Society Annual Symposium on VLSI: Trends in VLSI Technology and Design, ISVLSI 2008
Higgins M., MacNamee C., Mullane B. (2008) Proceedings - IEEE Computer Society Annual Symposium on VLSI: Trends in VLSI Technology and Design, ISVLSI 2008. :145-150
IET Conference Publications
Mullane B., Higgins M., MacNamee C. (2008) IET Conference Publications. :204-209
IET Conference Publications
Higgins M., MacNamee C., Mullane B. (2008) IET Conference Publications. :198-203
2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS
Mullane, B; Higgins, M; MacNamee, C (2008) 2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. :747-756
2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
Higgins, M; MacNamee, C; Mullane, B (2008) 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS. :326-331
Proceedings of IEEE Test Workshop
MacNamee, C, Heffernan, D (2004) Proceedings of IEEE Test Workshop. :305-314
Proceedings of IEEE Test Workshop
MacNamee, C., Heffernan, D. (2004) Proceedings of IEEE Test Workshop. :305-314
Proceedings of IEEE IC Test Workshop
MacNamee, C., Heffernan, D (2004) Proceedings of IEEE IC Test Workshop.
Irish Signals and Systems Conference
MacNamee, C. and D. Heffernan. 2001 (2001) Irish Signals and Systems Conference. :463-468
Irish Signals and Systems Conference
MacNamee, C. and Heffernan, D (2001) Irish Signals and Systems Conference. :463-468
Proceedings of Irish Signals and Systems Conference, Maynooth. Ireland
MacNamee, C. and Heffernan, D. (2001) Proceedings of Irish Signals and Systems Conference, Maynooth. Ireland.
Conference Contributions
Published Reports
Editorials
Book Reviews
Other Publications
FPGA PROTOTYPING OF A SCAN BASED SYSTEM-ON-CHIP DESIGN
Mullane, B; Higgins, M; MacNamee, C; Chen-Huan Chiang; Chakraborty, TJ; Cook, TB (2007) FPGA PROTOTYPING OF A SCAN BASED SYSTEM-ON-CHIP DESIGN. Montpellier
Optimisation of IEEE 1500 Wrappers and User Defined TAMs
Higgins, M; Macnamee, C; Mullane, B (2007) Optimisation of IEEE 1500 Wrappers and User Defined TAMs. Boxborough, MA, USA : IEEE
Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment
Mullane, B; MacNamee, C (2007) Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment. : Korean Semiconductor IP Exchange
Optimisation and Control of IEEE 1500 Wrappers and User Defined TAMs
Higgins, M; MacNamee, C; Mullane, B (2007) Optimisation and Control of IEEE 1500 Wrappers and User Defined TAMs. Blanchardstown : Blanchardstown IT
Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment
Mullane, B; MacNamee, C (2006) Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment. Grenoble, France : Design & Reuse