Skip to main content

Publication

A Tractable Measure of Nanomaterial Risk using Bayesian Networks
Murphy, F., Sheehan, B., Mullins, M., Bouwmeester, H., Marvin, H., Bouzembrak, Y., Costa, A.L., Das, R., Stone, V., Tofail, S.A.M.
Nanoscale Research Letters (2016)