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Home | A Tractable Measure of Nanomaterial Risk using Bayesian Networks
A Tractable Measure of Nanomaterial Risk using Bayesian Networks
Murphy, F., Sheehan, B., Mullins, M., Bouwmeester, H., Marvin, H., Bouzembrak, Y., Costa, A.L., Das, R., Stone, V., Tofail, S.A.M.
Nanoscale Research Letters (2016)