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Temperature and strain dependence of the roughening transition in III-V semiconductor and SiGe epitaxial growth
Bangert, U. and Harvey, A.J. and Dieker, C. and Hartdegen, H. and Vescan, L. and Smith, A.
(1995)
Temperature and strain dependence of the roughening transition in III-V semiconductor and SiGe epitaxial growth in Journal of Applied Physics 10.1063/1.360270