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Home | Quantitative analysis of lattice strains and crystal polarity in semiconductor nanomaterials using convergent beam electron dffraction
Quantitative analysis of lattice strains and crystal polarity in semiconductor nanomaterials using convergent beam electron dffraction
Mogili, Naga Vishnu V
(2013)
Quantitative analysis of lattice strains and crystal polarity in semiconductor nanomaterials using convergent beam electron dffraction University of LimerickUniversity of Limerick