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Home | Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS
Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS
Ramasse, Q.M. and Alem, N. and Yazyev, O.V. and Zettl, A. and Pan, C.T. and Nair, R.R. and Jalil, R. and Zan, R. and Bangert, U. and Seabourne, C.R. and Scott, A.J. and Novoselov, K.S.
Microscopy and Microanalysis (2012)
10.1017/S1431927612009488