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Home | An Optimal IEEE 1500 Core Wrapper Design for Improved Test Access and Reduced Test Time. 16th IET Irish Signals and Systems Conference
An Optimal IEEE 1500 Core Wrapper Design for Improved Test Access and Reduced Test Time. 16th IET Irish Signals and Systems Conference
Brendan Mullane,Michael Higgins,Ciaran MacNamee
(2008)
An Optimal IEEE 1500 Core Wrapper Design for Improved Test Access and Reduced Test Time. 16th IET Irish Signals and Systems Conference in 16th IET Irish Signals and Systems Conference