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Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy
Bangert, U. and Stewart, A. and O'Connell, E. and Courtney, E. and Ramasse, Q. and Kepaptsoglou, D. and Hofsäss, H. and Amani, J. and Tu, J.-S. and Kardynal, B.
(2017)
Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy in Ultramicroscopy 10.1016/j.ultramic.2016.12.011