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Home | Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy
Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy
Bangert, U,Stewart, A,O'Connell, E,Courtney, E,Ramasse, Q,Kepaptsoglou, D,Hofsass, H,Anioni, J,Tu, JS,Kardynal, B
(2017)
Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy in Ultramicroscopy 10.1016/j.ultramic.2016.12.011