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Home | Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM
Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM
Bangert, U. and Gass, M. and Siller, L. and Coxon, R. and Chao, Y. and Horrocks, B.R.
(2008)
Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM in Journal of Physics: Conference Series 10.1088/1742-6596/126/1/012066