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Highly spatially resolved X-ray analysis of semiconductor alloys and nanostructures in a scanning transmission electron microscope
Bangert, U. and Harvey, A.J. and Dieker, C. and Hartmann, A. and Keyse, R.
(1996)
Highly spatially resolved X-ray analysis of semiconductor alloys and nanostructures in a scanning transmission electron microscope in Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties 10.1080/01418619608240733