Biography
Electronic and Computer Engineer, specialising in embedded systems development and digital design and testing.
16 years industrial experience on electronic and embedded systems design
15 years academic experience, researching and teaching embedded systems design, digital systems design and test and computer architecture.
Research Interests
Design, development and testing and debugging of embedded system, with particular emphasis on debugging and verification of real-time systems.
Test engineering, with emphasis on SoC test and low power scan testing.
Teaching Interests
Embedded Systems, Hardware and Software
Computer Architecture
Test Engineering
Professional Activities
Award
- 2014 - Winter Award for Excellence in Teaching
Education
- 2008 University of Limerick - PhD
- 1996 University of Limerick - M.Eng
- 1980 NIHE, Limerick (now UL) - Graduate Diploma
- 1978 University College Dublin - BE
Employment
- 2000 University of Limerick - Lecturer Below The Bar
- 1986 Ashling Microsystems Ltd - Senior Design Engineer/Project Leader
- 1984 LDC/Milton Roy, Shannon Industrial Estate, Co Clare, Ireland - Electronic Engineer
- 1983 NIHE, Limerick (now University of Limerick) - Research Assistant
- 1982 Waterford Regional Technical College (now Waterford IT) - Temporary Lecturer
- 1978 SIFA Chemicals, Shannon Industrial Estate, Co Clare - Chemical Engineer
Association
- 1991 Member, IEEE
Publications
Book Chapter
Strategies for a Flexible Approach to Incorporating Real Experiments in Blended Learning
Hall, T; McHugo, C; MacNamee, C; Hayes, MJ
New Achievements for DLE in the ViReC Project 2004
Conference Publication
On-chip Instrumentation for Runtime Verification in Deeply Embedded Processors
MacNamee, C,Heffernan, D,
2015 Ieee Computer Society Annual Symposium On Vlsi
DOI: 10.1109/ISVLSI.2015.38
Performance Verification of a 12-Bit, 25Msps, Successive Approximation Register Analogue-to-Digital Converter on 65nm CMOS
Egan, M,MacNamee, C,Scanlan, T,
2015 26th Irish Signals And Systems Conference (Issc)
ISVLSI 2015 - IEEE International Conference on VLSI, Montpellier, France.
MacNamee, C., Heffernan, D.
International Test Conference, (ITC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
DOI: 10.1109/TEST.2009.5355722
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
DOI: 10.1109/DDECS.2009.5012087
ITC: 2009 INTERNATIONAL TEST CONFERENCE
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T
IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T
ACM Great Lakes Symposium on VLSI, (GLSVLSI)
Mullane B., MacNamee C., O'Brien V., Fleischmann T.
DOI: 10.1145/1531542.1531564
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, (DDECS)
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T
A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. Test Conference, 2009. ITC 2009. International
Mullane, B.,O'Brien, V.,MacNamee, C.,Fleischmann, T.
Test Conference, 2009. ITC 2009. International
IEEE International SOC Conference, (SOCC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
DOI: 10.1109/SOCCON.2009.5398065
GLSVLSI 2009: PROCEEDINGS OF THE 2009 GREAT LAKES SYMPOSIUM ON VLSI
Mullane, B,MacNamee, C,O'Brien, V,Fleischmann, T,
Glsvlsi 2009: Proceedings Of The 2009 Great Lakes Symposium On Vlsi
2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS
Mullane, B; Higgins, M; MacNamee, C
Proceedings - IEEE Computer Society Annual Symposium on VLSI: Trends in VLSI Technology and Design, ISVLSI 2008
Higgins M., MacNamee C., Mullane B.
DOI: 10.1109/ISVLSI.2008.36
2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
Higgins, M; MacNamee, C; Mullane, B
IET Conference Publications
Mullane B., Higgins M., MacNamee C.
DOI: 10.1049/cp:20080663
IET Conference Publications
Higgins M., MacNamee C., Mullane B.
DOI: 10.1049/cp:20080662
Proceedings of IEEE IC Test Workshop
MacNamee, C., Heffernan, D
Proceedings of IEEE Test Workshop
MacNamee, C, Heffernan, D
Proceedings of IEEE Test Workshop
MacNamee, C., Heffernan, D.
Irish Signals and Systems Conference
MacNamee, C. and D. Heffernan. 2001
Irish Signals and Systems Conference
MacNamee, C. and Heffernan, D
Proceedings of Irish Signals and Systems Conference, Maynooth. Ireland
MacNamee, C. and Heffernan, D.
Other Publication
Optimisation and Control of IEEE 1500 Wrappers and User Defined TAMs
Higgins, M; MacNamee, C; Mullane, B
FPGA PROTOTYPING OF A SCAN BASED SYSTEM-ON-CHIP DESIGN
Mullane, B; Higgins, M; MacNamee, C; Chen-Huan Chiang; Chakraborty, TJ; Cook, TB
Optimisation of IEEE 1500 Wrappers and User Defined TAMs
Higgins, M; Macnamee, C; Mullane, B
Peer Reviewed Journal
Runtime observation of functional safety properties in an automotive control network
Heffernan, D,MacNamee, C
Journal Of Systems Architecture
DOI: 10.1016/j.sysarc.2016.05.001
Runtime verification monitoring for automotive embedded systems using the ISO 26262 Functional Safety Standard as a guide for the definition of the monitored properties
Heffernan, D,MacNamee, C,Fogarty, P
IET Software
DOI: 10.1049/iet-sen.2013.0236
On-chip support for software verification and debug in multi-core embedded systems
Fogarty, P,MacNamee, C,Heffernan, D
IET Software
DOI: 10.1049/iet-sen.2011.0212
Design and implementation challenges for adoption of the IEEE 1500 standard
Higgins, M; MacNamee, C; Mullane, B
Iet Computers And Digital Techniques
DOI: 10.1049/iet-cdt.2008.0141
Design and implementation challenges for adoption of the IEEE 1500 standard
Higgins, M.,MacNamee, C.,Mullane, B.
Computers & Digital Techniques, Ietcomputers & Digital Techniques, Iet
Debugging Techniques for real-time Embedded Systems
MacNamee, C; Heffernan, D
Elektron Journal, South African Iee
Emerging on-chip debugging techniques for real-time embedded systems
MacNamee, C; Heffernan, D
Computing & Control Engineering Journal
DOI: 10.1049/cce:20000608