Dr. Ciaran Mac Namee

Runtime observation of functional safety properties in an automotive control network
Heffernan, D,MacNamee, C
(2016) Runtime observation of functional safety properties in an automotive control network
In Journal Of Systems Architecture; pp. 38-50
DOI: 10.1016/j.sysarc.2016.05.001
[ULIR]

Runtime verification monitoring for automotive embedded systems using the ISO 26262 Functional Safety Standard as a guide for the definition of the monitored properties
Heffernan, D,MacNamee, C,Fogarty, P
(2014) Runtime verification monitoring for automotive embedded systems using the ISO 26262 Functional Safety Standard as a guide for the definition of the monitored properties
In IET Software; pp. 193-203
DOI: 10.1049/iet-sen.2013.0236

On-chip support for software verification and debug in multi-core embedded systems
Fogarty, P,MacNamee, C,Heffernan, D
(2013) On-chip support for software verification and debug in multi-core embedded systems
In IET Software; pp. 56-64
DOI: 10.1049/iet-sen.2011.0212

Design and implementation challenges for adoption of the IEEE 1500 standard
Higgins, M; MacNamee, C; Mullane, B
(2010) Design and implementation challenges for adoption of the IEEE 1500 standard
In Iet Computers And Digital Techniques; pp. 38-49
DOI: 10.1049/iet-cdt.2008.0141

Design and implementation challenges for adoption of the IEEE 1500 standard
Higgins, M.,MacNamee, C.,Mullane, B.
(2010) Design and implementation challenges for adoption of the IEEE 1500 standard
In Computers & Digital Techniques, Ietcomputers & Digital Techniques, Iet; pp. 38-49

Debugging Techniques for real-time Embedded Systems
MacNamee, C; Heffernan, D
(2001) Debugging Techniques for real-time Embedded Systems
In Elektron Journal, South African Iee; pp. 23-26

Emerging on-chip debugging techniques for real-time embedded systems
MacNamee, C; Heffernan, D
(2000) Emerging on-chip debugging techniques for real-time embedded systems
In Computing & Control Engineering Journal; pp. 295-303
DOI: 10.1049/cce:20000608

On-chip Instrumentation for Runtime Verification in Deeply Embedded Processors
MacNamee, C,Heffernan, D,
(2015) On-chip Instrumentation for Runtime Verification in Deeply Embedded Processors
In 2015 Ieee Computer Society Annual Symposium On Vlsi; pp. 374-379
DOI: 10.1109/ISVLSI.2015.38

Performance Verification of a 12-Bit, 25Msps, Successive Approximation Register Analogue-to-Digital Converter on 65nm CMOS
Egan, M,MacNamee, C,Scanlan, T,
(2015) Performance Verification of a 12-Bit, 25Msps, Successive Approximation Register Analogue-to-Digital Converter on 65nm CMOS
In 2015 26th Irish Signals And Systems Conference (Issc);

ISVLSI 2015 - IEEE International Conference on VLSI, Montpellier, France.
MacNamee, C., Heffernan, D.
(2015) ISVLSI 2015 - IEEE International Conference on VLSI, Montpellier, France.

25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
O'Brien, V.; MacNamee, C.; Mullane, B.
(2014) 25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
pp. 418-423 Limerick, Ireland
DOI: 10.1049/cp.2014.0725

25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
Indino, I., MacNamee, C.
(2014) 25th IET Irish Signals & Systems Conference 2014 and 2014 China-Ireland International Conference on Information and Communications Technologies (ISSC 2014/CIICT 2014).
pp. 227-232 Limerick, Ireland
DOI: 10.1049/cp.2014.0690

ITC: 2009 INTERNATIONAL TEST CONFERENCE
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T
(2009) ITC: 2009 INTERNATIONAL TEST CONFERENCE
pp. 368-377

IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, (DDECS)
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T
(2009) IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, (DDECS)
pp. 4-7

IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS
Mullane, B; OBrien, V; MacNamee, C; Fleischmann, T
(2009) IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS
pp. 169-172

IEEE International SOC Conference, (SOCC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
(2009) IEEE International SOC Conference, (SOCC)
pp. 169-172
DOI: 10.1109/SOCCON.2009.5398065

International Test Conference, (ITC)
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
(2009) International Test Conference, (ITC)

DOI: 10.1109/TEST.2009.5355722

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. Test Conference, 2009. ITC 2009. International
Mullane, B.,O'Brien, V.,MacNamee, C.,Fleischmann, T.
(2009) A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. Test Conference, 2009. ITC 2009. International
In Test Conference, 2009. ITC 2009. International; pp. 1-10

ACM Great Lakes Symposium on VLSI, (GLSVLSI)
Mullane B., MacNamee C., O'Brien V., Fleischmann T.
(2009) ACM Great Lakes Symposium on VLSI, (GLSVLSI)
pp. 81-86
DOI: 10.1145/1531542.1531564

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
Mullane B., O'Brien V., MacNamee C., Fleischmann T.
(2009) Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
pp. 4-7
DOI: 10.1109/DDECS.2009.5012087

GLSVLSI 2009: PROCEEDINGS OF THE 2009 GREAT LAKES SYMPOSIUM ON VLSI
Mullane, B,MacNamee, C,O'Brien, V,Fleischmann, T,
(2009) GLSVLSI 2009: PROCEEDINGS OF THE 2009 GREAT LAKES SYMPOSIUM ON VLSI
In Glsvlsi 2009: Proceedings Of The 2009 Great Lakes Symposium On Vlsi; pp. 81-86

IET Conference Publications
Mullane B., Higgins M., MacNamee C.
(2008) IET Conference Publications
pp. 204-209
DOI: 10.1049/cp:20080663

IET Conference Publications
Higgins M., MacNamee C., Mullane B.
(2008) IET Conference Publications
pp. 198-203
DOI: 10.1049/cp:20080662

2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS
Mullane, B; Higgins, M; MacNamee, C
(2008) 2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS
pp. 747-756

Proceedings - IEEE Computer Society Annual Symposium on VLSI: Trends in VLSI Technology and Design, ISVLSI 2008
Higgins M., MacNamee C., Mullane B.
(2008) Proceedings - IEEE Computer Society Annual Symposium on VLSI: Trends in VLSI Technology and Design, ISVLSI 2008
pp. 145-150
DOI: 10.1109/ISVLSI.2008.36

2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
Higgins, M; MacNamee, C; Mullane, B
(2008) 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
pp. 326-331

Proceedings of IEEE Test Workshop
MacNamee, C, Heffernan, D
(2004) Proceedings of IEEE Test Workshop
IEEE(Ed.) pp. 305-314

Proceedings of IEEE Test Workshop
MacNamee, C., Heffernan, D.
(2004) Proceedings of IEEE Test Workshop
IEEE(Ed.) pp. 305-314

Proceedings of IEEE IC Test Workshop
MacNamee, C., Heffernan, D
(2004) Proceedings of IEEE IC Test Workshop

Irish Signals and Systems Conference
MacNamee, C. and Heffernan, D
(2001) Irish Signals and Systems Conference
*(Ed.) pp. 463-468

Proceedings of Irish Signals and Systems Conference, Maynooth. Ireland
MacNamee, C. and Heffernan, D.
(2001) Proceedings of Irish Signals and Systems Conference, Maynooth. Ireland

Irish Signals and Systems Conference
MacNamee, C. and D. Heffernan. 2001
(2001) Irish Signals and Systems Conference
R. Shorten, T. Ward, T. Lysaght(Ed.) pp. 463-468

FPGA PROTOTYPING OF A SCAN BASED SYSTEM-ON-CHIP DESIGN
Mullane, B; Higgins, M; MacNamee, C; Chen-Huan Chiang; Chakraborty, TJ; Cook, TB
(2007) FPGA PROTOTYPING OF A SCAN BASED SYSTEM-ON-CHIP DESIGN
ReSCos2007(Ed.) Montpellier :

Optimisation of IEEE 1500 Wrappers and User Defined TAMs
Higgins, M; Macnamee, C; Mullane, B
(2007) Optimisation of IEEE 1500 Wrappers and User Defined TAMs
(Ed.) Boxborough, MA, USA : IEEE Boxborough, MA, USA

Optimisation and Control of IEEE 1500 Wrappers and User Defined TAMs
Higgins, M; MacNamee, C; Mullane, B
(2007) Optimisation and Control of IEEE 1500 Wrappers and User Defined TAMs
(Ed.) Blanchardstown : Blanchardstown IT Blanchardstown

Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment
Mullane, B; MacNamee, C
(2007) Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment
James K, Huh/KIPEX(Ed.) Korean Semiconductor IP Exchange

Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment
Mullane, B; MacNamee, C
(2006) Developing a Reusable IP Platform within a System-on-Chip Design Framework targeted towards an Academic R&D Environment
(Ed.) Grenoble, France : Design & Reuse Grenoble, France