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Atom-by-atom STEM investigation of defect engineering in graphene
Ramasse, Q.M. and Kepapstoglou, D.M. and Hage, F.S. and Susi, T. and Kotakoski, J. and Mangler, C. and Ayala, P. and Meyer, J. and Hinks, J.A. and Donnelly, S. and Zan, R. and Pan, C.T. and Haigh, S.J. and Bangert, U.
(2014)
Atom-by-atom STEM investigation of defect engineering in graphene in Microscopy and Microanalysis 10.1017/S1431927614010411