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Assessment of electron energy-loss spectroscopy below 5 eV in semiconductor materials in a VG STEM
Bangert, U. and Harvey, A.J. and Keyse, R.
(1997)
Assessment of electron energy-loss spectroscopy below 5 eV in semiconductor materials in a VG STEM in Ultramicroscopy 10.1016/S0304-3991(97)00025-9