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A Tractable Method for Measuring Nanomaterial Risk Using Bayesian Networks
Murphy, F,Sheehan, B,Mullins, M,Bouwmeester, H,Marvin, HJP,Bouzembrak, Y,Costa, AL,Das, R,Stone, V,Tofail, SAM
Nanoscale Research Letters (2016)
10.1186/s11671-016-1724-y