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A Tractable Measure of Nanomaterial Risk using Bayesian Networks
Murphy, F., Sheehan, B., Mullins, M., Bouwmeester, H., Marvin, H., Bouzembrak, Y., Costa, A.L., Das, R., Stone, V., Tofail, S.A.M.
(2016)
A Tractable Measure of Nanomaterial Risk using Bayesian Networks in Nanoscale Research Letters